Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits. - Matteo Buffolo; M. Pietrobon; Carlo De Santi; F. Samparisi; Michael L. Davenport; John E. Bowers 001; Gaudenzio Meneghesso; Enrico Zanoni; Matteo Meneghini (Microelectron. Reliab., 2018)