A study of the threshold-voltage suitability as an application-related reliability indicator for planar-gate non-punch-through IGBTs. - Alberto Castellazzi; Mauro Ciappa; Wolfgang Fichtner; M. Piton; Michel Mermet-Guyennet (Microelectron. Reliab., 2007)

Revisiting power cycling test for better life-time prediction in traction. - Michel Mermet-Guyennet; X. Perpiñà; M. Piton (Microelectron. Reliab., 2007)

Failure-relevant abnormal events in power inverters considering measured IGBT module temperature inhomogeneities. - X. Perpiñà; Alberto Castellazzi; M. Piton; Michel Mermet-Guyennet; José Millán (Microelectron. Reliab., 2007)

Local thermal cycles determination in thermosyphon-cooled traction IGBT modules reproducing mission profiles. - X. Perpiñà; M. Piton; Michel Mermet-Guyennet; Xavier Jordà; José Millán (Microelectron. Reliab., 2007)

Robustness test and failure analysis of IGBT modules during turn-off. - Jesús Urresti-Ibañez; Alberto Castellazzi; M. Piton; José Rebollo; Michel Mermet-Guyennet; Mauro Ciappa (Microelectron. Reliab., 2007)