Use of a Segmentation Technique to Analyze the Variability of the Yield of a Mature CMOS SRAM. - Frederic Duvivier; M. Rivier; B. Burtschy; J. J. Charlot (DFT, 1993)

Approximation of critical area of ICs with simple parameters extracted from the layout. - Frederic Duvivier; M. Rivier (DFT, 1995)