Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments. - Ivan de Paúl; M. Rosales; Bartomeu Alorda; Jaume Segura 001; Charles F. Hawkins; Jerry M. Soden (VTS, 2001)

Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs. - Bartomeu Alorda; M. Rosales; Jerry M. Soden; Charles F. Hawkins; Jaume Segura 001 (ITC, 2002)

Within Die Thermal Gradient Impact on Clock-Skew: A New Type of Delay-Fault Mechanism. - Sebastià A. Bota; M. Rosales; José Luis Rosselló; Jaume Segura 001; Ali Keshavarzi (ITC, 2004)

Smart Temperature Sensor for Thermal Testing of Cell-Based ICs. - Sebastià A. Bota; M. Rosales; José Luis Rosselló; Jaume Segura 001 (DATE, 2005)

Low V_D_D vs. Delay: Is it Really a Good Correlation Metric for Nanometer ICs?. - Sebastià A. Bota; M. Rosales; José Luis Rosselló; Jaume Segura 001 (VTS, 2006)

LAGOVirtual: A Collaborative Environment for the Large Aperture GRB Observatory - R. Camacho; Reinaldo Chacón; Gilberto Díaz; C. Guada; Vanessa Hamar; Herbert Hoeger; A. Melfo; Luis A. Núñez; Y. Pérez; Carlos Quintero; M. Rosales; Rodrigo Torrens (CoRR, 2009)