The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress. - M. S. B. Sowariraj; Theo Smedes; Cora Salm; Ton J. Mouthaan; Fred G. Kuper (Microelectron. Reliab., 2002)

Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy. - M. S. B. Sowariraj; Theo Smedes; Cora Salm; Ton J. Mouthaan; Fred G. Kuper (Microelectron. Reliab., 2003)

A 3-D Circuit Model to evaluate CDM performance of ICs. - M. S. B. Sowariraj; Theo Smedes; Peter C. de Jong; Cora Salm; Ton J. Mouthaan; Fred G. Kuper (Microelectron. Reliab., 2005)