Bayesian analysis of masked series system lifetime data from a family of lifetime distributions. - Sanjeev K. Tomer; Ashok K. Singh; M. S. Panwar (Int. J. Syst. Assur. Eng. Manag., 2014)

Analysis of masked data with Lindley failure model. - Himanshu Rai; M. S. Panwar; Sanjeev K. Tomer (Commun. Stat. Simul. Comput., 2023)

A latent variable approach for modeling recall-based time-to-event data with Weibull distribution. - M. S. Panwar; Vikas Barnwal; Chandra Prakash Yadav (Comput. Stat., 2024)