Facet-free surface-emitting 1.3-μm DFB laser. - Koichiro Adachi; Takanori Suzuki; T. Ohtoshi; K. Nakahara; M. Sagawa; Akira Nakanishi; Kazuhiko Naoe; Shigehisa Tanak (ECOC, 2015)

Accurate screening of defective oxide on SiC using consecutive multiple threshold-voltage measurements. - Hiroshi Miki; M. Sagawa; Y. Mori; T. Murata; K. Kinoshita; K. Asaka; T. Oda (IRPS, 2022)