Reliability investigations on HBV using pulsed electrical stress. - Cezary Sydlo; M. Saglam; Bastian Mottet; Manuel Rodríguez-Gironés; Hans L. Hartnagel (Microelectron. Reliab., 2002)

Laterally inhomogeneous barrier analysis of identically prepared Cd/CdS/n-Si/Au-Sb structures by SILAR method. - B. Güzeldir; M. Saglam; A. Ates (Microelectron. Reliab., 2011)

Effect of temperature on the capacitance-frequency and conductance-voltage characteristics of polyaniline/p-Si/Al MIS device at high frequencies. - Sakir Aydogan; M. Saglam; Abdulmecit Türüt (Microelectron. Reliab., 2012)