Molybdenum Nitride as a Scalable and Thermally Stable pWFM for CFET. - Hiroaki Arimura; S. Brus; Jacopo Franco; Yusuke Oniki; A. Vandooren; T. Conard; B. T. Chan; B. Kannan; M. Samiee; W. Li; P. Deminskyi; E. Shero; et al. (VLSI Technology and Circuits, 2023)

Modeling BTI Reliability in CMOS DRAM Periphery Device: A Review of BTI Analysis Tool (BAT). - A. Subirats; M. Samiee; G. Ferrari; U. Sharma; T. Imamoto; M. Yokomichi; S. Srivastava; K. Florent; T. Owens; A. S. Bisht; S. Mahapatra (IRPS, 2025)