Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design. - Antonis Papanikolaou; Miguel Miranda; Hua Wang; Francky Catthoor; M. Satyakiran; Pol Marchal; Ben Kaczer; C. Bruynseraede; Zsolt Tokei (VLSI-SoC, 2006)