Compared deep class-AB and class-B ageing on AlGaN/GaN HEMT in S-Band pulsed-RF operating life. - Jean-Baptiste Fonder; Olivier Latry; Cedric Duperrier; M. Stanislawiak; Hichame Maanane; Philippe Eudeline; Farid Temcamani (Microelectron. Reliab., 2012)