Wafer Level Accelerated test for ionic contamination control on VDMOS transistors in Bipolar/CMOS/DMOS. - Yannick Rey-Tauriac; M. Taurin; Olivier Bonnaud (Microelectron. Reliab., 2001)

High reliability power VDMOS Transistors in Bipolar/CMOS/DMOS technology. - Yannick Rey-Tauriac; M. Taurin; Olivier Bonnaud (Microelectron. Reliab., 2001)

Robustness improvement of VDMOS transistors in Bipolar/CMOS/DMOS technology. - Yannick Rey-Tauriac; Olivier de Sagazan; M. Taurin; Olivier Bonnaud (Microelectron. Reliab., 2003)