A new SIMPLORER model for single-electron transistors. - Aimen Boubaker; Nabil Sghaier; M. Troudi; A. Kalboussi; Nicolas Baboux; A. Souifi (Microelectron. J., 2007)

Macro-modeling for the compact simulation of single electron transistor using SIMPLORER. - M. Troudi; Nabil Sghaier; Aimen Boubaker; A. Souifi; A. Kalboussi (Microelectron. J., 2007)

Electrical characteristics and modelling of multi-island single-electron transistor using SIMON simulator. - Aimen Boubaker; M. Troudi; Nabil Sghaier; A. Souifi; Nicolas Baboux; A. Kalboussi (Microelectron. J., 2009)

Effect of illumination on the electron transport mechanisms in Silicon nanocrystal-based nanopixels. - S. Chatbouri; M. Troudi; Nabil Sghaier; A. Kalboussi; Dominique Drouin; V. Aimez; A. Souifi (SSD, 2013)

Impact of defect on I(V) instabilities observed on Ti/4H-SiC high voltage Schottky diodes. - N. Abdelwahed; M. Troudi; Nabil Sghaier; Abdelkader Souifi (Microelectron. Reliab., 2015)

Interface traps effect on the charge transport mechanisms in metal oxide semiconductor structures based on silicon nanocrystals. - S. Chatbouri; M. Troudi; A. Kalboussi; A. Souifi (Microelectron. Reliab., 2017)