Layout analysis as supporting tool for failure localization: Basic principles and case studies. - Claus Hartmann; M. Wieberneit (Microelectron. Reliab., 2008)

Investigation on marginal failure characteristics and related defects analysed by soft defect localization. - Claus Hartmann; M. Wieberneit (Microelectron. Reliab., 2009)

Investigation on BIST assisted failure analysis on digital integrated circuits. - Claus Hartmann; M. Wieberneit (Microelectron. Reliab., 2010)