A total entropy model of spatial data uncertainty. - Y. F. Shi; F. X. Jin; M. Y. Li (J. Inf. Sci., 2006)

Numerical and experimental analysis of the Sn3.5Ag0.75Cu solder joint reliability under thermal cycling. - Hongtao Chen; C. Q. Wang; M. Y. Li (Microelectron. Reliab., 2006)

Capability assessment for processes with multiple characteristics: A generalization of the popular index Cpk. - Wen Lea Pearn; J.-J. H. Shiau; Yu-Ting Tai; M. Y. Li (Qual. Reliab. Eng. Int., 2011)

An Optimization Method for Training Generalized Hidden Markov Model based on Generalized Jensen Inequality. - Youmin Hu; Fengyun Xie; Bo Wu 006; Yan Cheng; Guangfei Jia; Yan Wang 029; M. Y. Li (ICINCO (1), 2012)

Study of sub-5 nm RRAM, tunneling selector and selector less device. - Kai-Shin Li; Ming-Taou Lee; Min-Cheng Chen; Cho-Lun Hsu; J. M. Lu; C. H. Lin; C. C. Chen; B. W. Wu; Y. F. Hou; C. Yi. Lin; Y. J. Chen; T. Y. Lai; et al. (ISCAS, 2015)

A World First QLC RRAM: Highly Reliable Resistive-Gate Flash with Record 108 Endurance and Excellent Retention. - M. Y. Li; J. P. Lee; C. H. Liu; J. C. Guo; Steve S. Chung (IRPS, 2023)