Stress and resistivity analysis of electrodeposited gold films for MEMS application. - Subhadeep Kal; A. Bagolini; Benno Margesin; M. Zen (Microelectron. J., 2006)

Experimental study and analysis of corner compensation structures for CMOS compatible bulk micromachining using 25 wt% TMAH. - Ravindra Mukhiya; Alvise Bagolini; T. K. Bhattacharyya; Leandro Lorenzelli; M. Zen (Microelectron. J., 2011)