Numerical simulation and modeling of static characteristics and electrical noise in submicron MOS transistors. - M. Fadlallah; Gérard Ghibaudo; Jalal Jomaah; M. Zoaeter (ICECS, 2000)

Static and low frequency noise characterization of surface- and buried-mode 0.1 mum P and N MOSFETs. - M. Fadlallah; Gérard Ghibaudo; Jalal Jomaah; M. Zoaeter; G. Guégan (Microelectron. Reliab., 2002)

Bias temperature instability from gate charge characteristics investigations in N-Channel Power MOSFET. - M. Alwan; B. Beydoun; K. Ketata; M. Zoaeter (Microelectron. J., 2007)

Gate charge behaviors in N-channel power VDMOSFETs during HEF and PBT stresses. - M. Alwan; B. Beydoun; K. Ketata; M. Zoaeter (Microelectron. Reliab., 2007)