Transistor level test generation for MOS circuits. - Madhukar K. Reddy; Sudhakar M. Reddy; Prathima Agrawal (DAC, 1985)

Detecting FET Stuck-Open Faults in CMOS Latches and Flip-Flops. - Madhukar K. Reddy; Sudhakar M. Reddy (IEEE Des. Test, 1986)

Testable Realizations for FET Stuck-Open Faults CMOS Combinational Logic Circuits. - Sudhakar M. Reddy; Madhukar K. Reddy (IEEE Trans. Computers, 1986)

Partial and Perfect Path Covers of Cographs. - David G. Kirkpatrick; Madhukar K. Reddy; C. Pandu Rangan; Anand Srinivasan (Discret. Appl. Math., 1998)