Feature extraction and damage-precursors for prognostication of lead-free electronics. - Pradeep Lall; Madhura Hande; Chandan Bhat; Nokibul Islam; Jeff Suhling; Jay Lee (Microelectron. Reliab., 2007)

Prognostication of system-state in lead-free electronics equipment under cyclic and steady-state thermo-mechanical loads. - Pradeep Lall; Madhura Hande; Chandan Bhat; Vikrant More; Rahul Vaidya (Microelectron. Reliab., 2009)

Prognostication of Residual Life and Latent Damage Assessment in Lead-Free Electronics Under Thermomechanical Loads. - Pradeep Lall; Chandan Bhat; Madhura Hande; Vikrant More; Rahul Vaidya; Kai Goebel (IEEE Trans. Ind. Electron., 2011)