Defect-oriented dynamic fault models for embedded-SRAMs. - Simone Borri; Magali Hage-Hassan; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel (ETW, 2003)

Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution. - Luigi Dilillo; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Simone Borri; Magali Bastian Hage-Hassan (Asian Test Symposium, 2004)

Dynamic read destructive fault in embedded-SRAMs: analysis and march test solution. - Luigi Dilillo; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Simone Borri; Magali Bastian Hage-Hassan (ETS, 2004)

Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies. - Luigi Dilillo; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian (DAC, 2005)

Resistive-open defect influence in SRAM pre-charge circuits: analysis and characterization. - Luigi Dilillo; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian Hage-Hassan (ETS, 2005)

Data Retention Fault in SRAM Memories: Analysis and Detection Procedures. - Luigi Dilillo; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian Hage-Hassan (VTS, 2005)

Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test. - Simone Borri; Magali Hage-Hassan; Luigi Dilillo; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel (J. Electron. Test., 2005)

Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories. - Luigi Dilillo; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Simone Borri; Magali Hage-Hassan (J. Electron. Test., 2005)

March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit. - Luigi Dilillo; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian (DDECS, 2006)

ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions. - Luigi Dilillo; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Simone Borri; Magali Bastian Hage-Hassan (J. Electron. Test., 2006)

Influence of Threshold Voltage Deviations on 90nm SRAM Core-Cell Behavior. - Magali Bastian; Vincent Gouin; Patrick Girard 001; Christian Landrault; Alexandre Ney; Serge Pravossoudovitch; Arnaud Virazel (ATS, 2007)

Slow write driver faults in 65nm SRAM technology: analysis and March test solution. - Alexandre Ney; Patrick Girard 001; Christian Landrault; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian (DATE, 2007)

Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs. - Alexandre Ney; Patrick Girard 001; Christian Landrault; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian (ETS, 2007)

Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs. - Alexandre Ney; Patrick Girard 001; Christian Landrault; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian (VTS, 2007)

Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits. - Luigi Dilillo; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian (J. Electron. Test., 2007)

A Design-for-Diagnosis Technique for SRAM Write Drivers. - Alexandre Ney; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian; Vincent Gouin (DATE, 2008)

A Novel Dummy Bitline Driver for Read Margin Improvement in an eSRAM. - Michael Yap San Min; Philippe Maurine; Magali Bastian; Michel Robert (DELTA, 2008)

Statistical Sizing of an eSRAM Dummy Bitline Driver for Read Margin Improvement in the Presence of Variability Aspects. - Michael Yap San Min; Philippe Maurine; Magali Bastian; Michel Robert (ISVLSI, 2008)

A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs. - Alexandre Ney; Alberto Bosio; Luigi Dilillo; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian (ITC, 2008)

An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing. - Alexandre Ney; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian; Vincent Gouin (VTS, 2008)

A new design-for-test technique for SRAM core-cell stability faults. - Alexandre Ney; Luigi Dilillo; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian; Vincent Gouin (DATE, 2009)

Analysis of Resistive-Open Defects in SRAM Sense Amplifiers. - Alexandre Ney; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian (IEEE Trans. Very Large Scale Integr. Syst., 2009)