Test Time and Area Optimized BrST Scheme for Automotive ICs. - Nilanjan Mukherjee 001; Jerzy Tyszer; Daniel Tille; Mahendar Sapati; Yingdi Liu; Jeffrey Mayer; Sylwester Milewski; Elham K. Moghaddam; Janusz Rajski; Jedrzej Solecki (ITC, 2019)

Time and Area Optimized Testing of Automotive ICs. - Nilanjan Mukherjee 001; Daniel Tille; Mahendar Sapati; Yingdi Liu; Jeffrey Mayer; Sylwester Milewski; Elham K. Moghaddam; Janusz Rajski; Jedrzej Solecki; Jerzy Tyszer (IEEE Trans. Very Large Scale Integr. Syst., 2021)