25.7 Time-Borrowing Fast Mux-D Scan Flip-Flop with On-Chip Timing/Power/VMIN Characterization Circuits in 10nm CMOS. - Amit Agarwal 001; Steven Hsu; Simeon Realov; Mark A. Anders 001; Gregory K. Chen; Monodeep Kar; Raghavan Kumar; Huseyin Sumbul; Phil C. Knag; Himanshu Kaul; Sanu Mathew; Mahesh Kumashikar; et al. (ISSCC, 2020)