Guided test generation for isolation and detection of embedded trojans in ics. - Mainak Banga; Maheshwar Chandrasekar; Lei Fang 002; Michael S. Hsiao (ACM Great Lakes Symposium on VLSI, 2008)

C preprocessor use in numerical tools: an empirical analysis. - Edward B. Allen; Maheshwar Chandrasekar; Karolina A. Sarnowska (ACM Southeast Regional Conference, 2009)

Diagnostic Test Generation for silicon diagnosis with an incremental learning framework based on search state compatibility. - Maheshwar Chandrasekar; Michael S. Hsiao (HLDVT, 2009)

Fast circuit topology based method to configure the scan chains in Illinois Scan architecture. - Swapneel Donglikar; Mainak Banga; Maheshwar Chandrasekar; Michael S. Hsiao (ITC, 2009)

DFT + DFD: An Integrated Method for Design for Testability and Diagnosability. - Nikhil P. Rahagude; Maheshwar Chandrasekar; Michael S. Hsiao (Asian Test Symposium, 2010)

Search State Compatibility Based Incremental Learning Framework and Output Deviation Based X-filling for Diagnostic Test Generation. - Maheshwar Chandrasekar; Nikhil P. Rahagude; Michael S. Hsiao (J. Electron. Test., 2010)

Search State Extensibility based Learning Framework for Model Checking and Test Generation. - Maheshwar Chandrasekar (2010)

A Novel Learning Framework for State Space Exploration Based on Search State Extensibility Relation. - Maheshwar Chandrasekar; Michael S. Hsiao (VLSI Design, 2011)

Fault Collapsing Using a Novel Extensibility Relation. - Maheshwar Chandrasekar; Michael S. Hsiao (VLSI Design, 2011)

A novel diagnostic test generation methodology and its application in production failure isolation. - M. Enamul Amyeen; Dongok Kim; Maheshwar Chandrasekar; Mohammad Noman; Srikanth Venkataraman; Anurag Jain; Neha Goel; Ramesh Sharma (ITC, 2016)