Concomitants of Dual Generalized Order Statistics from Morgenstern Type Bivariate Generalized Exponential Distribution. - Saeid Tahmasebi; Ali Akbar Jafari; Mahmoud Afshari (J. Stat. Theory Appl., 2015)

An efficiency Bayesian unit root test in Unobserved-ARCH models. - Fazlolah Lak; Mahmood Afshari; Behzad Gholizadeh (Commun. Stat. Simul. Comput., 2017)

Nonlinear wavelet shrinkage estimator of nonparametric regularity regression function via cross-validation with simulation study. - Mahmoud Afshari (Int. J. Wavelets Multiresolution Inf. Process., 2017)

Wavelet shrinkage generalized Bayes estimation for elliptical distribution parameter's under LINEX loss. - Hamid Karamikabir; Mahmoud Afshari (Int. J. Wavelets Multiresolution Inf. Process., 2019)

Extended exp-G family of distributions: Properties, applications and simulation. - Morad Alizadeh; Mahmoud Afshari; Bistoon Hosseini; Thiago G. Ramires (Commun. Stat. Simul. Comput., 2020)

Generalized Bayesian shrinkage and wavelet estimation of location parameter for spherical distribution under balance-type loss: Minimaxity and admissibility. - Hamid Karamikabir; Mahmoud Afshari (J. Multivar. Anal., 2020)

Bayesian estimation for mean vector of multivariate normal distribution on the linear and nonlinear exponential balanced loss based on wavelet decomposition. - Ziba Batvandi; Mahmoud Afshari; Hamid Karamikabir (Int. J. Wavelets Multiresolution Inf. Process., 2024)

Two new Bayesian-wavelet thresholds estimations of elliptical distribution parameters under non-linear exponential balanced loss. - Ziba Batvandi; Mahmoud Afshari; Hamid Karamikabir (Commun. Stat. Simul. Comput., 2025)

Bayesian shrinkage wavelet estimation of mean matrix of the matrix variate normal distribution with application in de-noising. - Ziba Batvandi; Mahmoud Afshari; Hamid Karamikabir (Comput. Appl. Math., 2025)

The Extended Gompertz Model: Applications, Mean of Order P Assessment and Statistical Threshold Risk Analysis Based on Extreme Stresses Data. - Morad Alizadeh; Mahmoud Afshari; Javier E. Contreras-Reyes; Danial Mazarei; Haitham M. Yousof (IEEE Trans. Reliab., 2025)