Bias Stress Stability of ITO Transistors and its Dependence on Dielectric Properties. - Lauren Hoang; Alwin Daus; Sumaiya Wahid; Jimin Kwon; Jung-Soo Ko; Shengjun Qin; Mahnaz Islam; Krishna C. Saraswat; H.-S. Philip Wong; Eric Pop (DRC, 2022)