Methods and Metrics for Reliability Assessment. - Lirida Alves de Barros Naviner; Jean-François Naviner; Denis Teixeira Franco; Maí Correia R. de Vasconcelos (Fault-Tolerant Distributed Algorithms on VLSI Chips, 2008)

Reliability analysis of logic circuits based on signal probability. - Denis Teixeira Franco; Maí Correia Vasconcelos; Lirida A. B. Naviner; Jean-François Naviner (ICECS, 2008)

On the output events in concurrent error detection schemes. - Maí Correia R. de Vasconcelos; Denis Teixeira Franco; Lirida A. B. Naviner; Jean-François Naviner (ICECS, 2008)

Signal probability for reliability evaluation of logic circuits. - Denis Teixeira Franco; Maí Correia Vasconcelos; Lirida A. B. Naviner; Jean-François Naviner (Microelectron. Reliab., 2008)

Relevant metrics for evaluation of concurrent error detection schemes. - Maí Correia R. de Vasconcelos; Denis Teixeira Franco; Lirida A. B. Naviner; Jean-François Naviner (Microelectron. Reliab., 2008)

On evaluating the signal reliability of self-checking arithmetic circuits. - Denis Teixeira Franco; Maí Correia Vasconcelos; Lirida A. B. Naviner; Jean-François Naviner (SBCCI, 2010)