Trap Density Modulation for IO FinFET NBTI Improvement. - Rakesh Ranjan; Charles B. LaRow; Ki-Don Lee; Minhyo Kang; Pavitra R. Perepa; Md. Shahriar Rahman; Bong Ki Lee; David Moreau; Carolyn Cariss-Daniels; Timothy Basford; Colby Callahan; Maihan Nguyen; et al. (IRPS, 2020)

Systematic Study of Process Impact on FinFET Reliability. - Rakesh Ranjan; Ki-Don Lee; Md Iqbal Mahmud; Mohammad Shahriar Rahman; Pavitra Ramadevi Perepa; Charles Briscoe LaRow; Caleb Dongkyun Kwon; Maihan Nguyen; Minhyo Kang; Ashish Kumar Jha 005; Ahmed Shariq; Shamas Musthafa Ummer; et al. (IRPS, 2021)