Robust Evaluation of Weighted Random Logic BIST Structures in Industrial Designs. - Rene Krenz-Baath; Friedrich Hapke; Rolf Hinze; Reinhard Meier; Maija Ryynaenen; Andreas Glowatz (DSD, 2012)

Bridge over troubled waters: Critical area based pattern generation. - Peter C. Maxwell; Friedrich Hapke; Maija Ryynaenen; Peter Weseloh (ETS, 2017)

Measuring Non-Redundant VIA Test-Coverage for Automotive Designs in Lower Process Nodes. - Saidapet Ramesh; Rahul Kalyan; Jesse Yanez; Andreas Glowatz; Maija Ryynänen; Sergej Schwarz (ITC, 2023)