Generalized test automation method for MOSFET's including characteristics measurements and model parameters extraction for aero-space applications. - Konstantin O. Petrosyants; Lev M. Sambursky; Igor A. Kharitonov; Mamed R. Ismail-Zade (EWDTS, 2017)

Prediction of High-Temperature Operation (up to +300°C) of Reference Voltage Source Built with Temperature-Tolerant Production Technology. - Lev M. Sambursky; Dmitry A. Parfenov; Mamed R. Ismail-Zade; Alexander S. Boldov; Borislav S. Dubyaga (EWDTS, 2018)

SPICE Compact BJT, MOSFET, and JFET Models for ICs Simulation in the Wide Temperature Range (From -200 °C to +300 °C). - Konstantin O. Petrosyants; Lev M. Sambursky; Maxim V. Kozhukhov; Mamed R. Ismail-Zade; Igor A. Kharitonov; Bo Li 051 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021)