EM algorithm for one-shot device testing under the exponential distribution. - Narayanaswamy Balakrishnan 001; Man Ho Ling (Comput. Stat. Data Anal., 2012)

Multiple-Stress Model for One-Shot Device Testing Data Under Exponential Distribution. - Narayanaswamy Balakrishnan 001; Man Ho Ling (IEEE Trans. Reliab., 2012)

Expectation Maximization Algorithm for One Shot Device Accelerated Life Testing with Weibull Lifetimes, and Variable Parameters over Stress. - Narayanaswamy Balakrishnan 001; Man Ho Ling (IEEE Trans. Reliab., 2013)

Healthcare Intelligence: Turning Data into Knowledge. - Hui Yang 003; O. Erhun Kundakcioglu; Jing Li 016; Teresa Wu; Joseph Ross Mitchell; Amy K. Hara; William Pavlicek; Leland S. Hu; Alvin C. Silva; Christine M. Zwart; Sait Tunç; Oguzhan Alagöz; et al. (IEEE Intell. Syst., 2014)

Gamma lifetimes and one-shot device testing analysis. - Narayanaswamy Balakrishnan 001; Man Ho Ling (Reliab. Eng. Syst. Saf., 2014)

Best Constant-Stress Accelerated Life-Test Plans With Multiple Stress Factors for One-Shot Device Testing Under a Weibull Distribution. - Narayanaswamy Balakrishnan 001; Man Ho Ling (IEEE Trans. Reliab., 2014)

EM algorithm for one-shot device testing with competing risks under exponential distribution. - Narayanaswamy Balakrishnan 001; Hon Yiu So; Man Ho Ling (Reliab. Eng. Syst. Saf., 2015)

Accelerated Degradation Analysis for the Quality of a System Based on the Gamma Process. - Man Ho Ling; Kwok-Leung Tsui; Narayanaswamy Balakrishnan 001 (IEEE Trans. Reliab., 2015)

A Bayesian Approach for One-Shot Device Testing With Exponential Lifetimes Under Competing Risks. - Narayanaswamy Balakrishnan 001; Hon Yiu So; Man Ho Ling (IEEE Trans. Reliab., 2016)

EM Algorithm for One-Shot Device Testing With Competing Risks Under Weibull Distribution. - Narayanaswamy Balakrishnan 001; Hon Yiu So; Man Ho Ling (IEEE Trans. Reliab., 2016)

Autopsy Data Analysis for a Series System With Active Redundancy Under a Load-Sharing Model. - Man Ho Ling; Hon Keung Tony Ng; Ping Shing Chan; Narayanaswamy Balakrishnan 001 (IEEE Trans. Reliab., 2016)

Likelihood Inference Under Proportional Hazards Model for One-Shot Device Testing. - Man Ho Ling; Hon Yiu So; Narayanaswamy Balakrishnan 001 (IEEE Trans. Reliab., 2016)

Learning Analytics for Monitoring Students Participation Online: Visualizing Navigational Patterns on Learning Management System. - Leonard K. M. Poon; Siu-Cheung Kong; Thomas S. H. Yau; Michael Y. W. Wong; Man Ho Ling (ICBL, 2017)

Efficient heterogeneous sampling for stochastic simulation with an illustration in health care applications. - Man Ho Ling; Shui Yee Wong; Kwok-Leung Tsui (Commun. Stat. Simul. Comput., 2017)

Comparison of algorithms to simulate disease transmission. - Xiaobei Shen; Zoie Shui-Yee Wong; Man Ho Ling; David Goldsman; Kwok-Leung Tsui (J. Simulation, 2017)

Model Mis-Specification Analyses of Weibull and Gamma Models Based on One-Shot Device Test Data. - Man Ho Ling; Narayanaswamy Balakrishnan 001 (IEEE Trans. Reliab., 2017)

Bayesian and likelihood inferences on remaining useful life in two-phase degradation models under gamma process. - Man Ho Ling; H. K. T. Ng; Kwok Leung Tsui (Reliab. Eng. Syst. Saf., 2019)

Optimal design of simple step-stress accelerated life tests for one-shot devices under Weibull distributions. - Man Ho Ling; X. W. Hu (Reliab. Eng. Syst. Saf., 2020)

Prognostics for lithium-ion batteries using a two-phase gamma degradation process model. - Chun Pang Lin; Man Ho Ling; Javier Cabrera; Fangfang Yang; Denis Yau Wai Yu; Kwok Leung Tsui (Reliab. Eng. Syst. Saf., 2021)

Exact tests for outliers in Laplace samples. - Chien-Tai Lin; Narayanaswamy Balakrishnan 001; Man Ho Ling (Commun. Stat. Simul. Comput., 2022)

Optimal designs of constant-stress accelerated life-tests for one-shot devices with model misspecification analysis. - Narayanaswamy Balakrishnan 001; Elena Castilla; Man Ho Ling (Qual. Reliab. Eng. Int., 2022)

On the application of inverted Dirichlet distribution for reliability inference of completely censored components with dependence structure. - Man Ho Ling; Narayanaswamy Balakrishnan 001; Suk Joo Bae (Comput. Ind. Eng., 2024)

A random-effect gamma process model with random initial degradation for accelerated destructive degradation testing data. - Man Ho Ling; Suk Joo Bae (Qual. Reliab. Eng. Int., 2024)

OTL web interface: outlier testing in lifetime data. - Chien-Tai Lin; Yu-Nan Wu; N. Balakrishnan 002; Man Ho Ling (Commun. Stat. Simul. Comput., 2024)

Artificial intelligence in teaching and teacher professional development: A systematic review. - Xiao Tan; Gary Cheng 001; Man Ho Ling (Comput. Educ. Artif. Intell., 2025)