Degradation Analysis of Nano-Contamination in Plasma Display Panels. - Suk Joo Bae; Seong-Joon Kim; Man Soo Kim; Bae Jin Lee; Chang Wook Kang (IEEE Trans. Reliab., 2008)

Reliability Prediction of Highly Scaled MOSFET Devices via Fractal Structure of Spatial Defects. - Seong-Joon Kim; Man Soo Kim; Suk Joo Bae (IEEE Access, 2019)