A self-referenced on-chip jitter BIST with sub-picosecond resolution in 28 nm FD-SOI technology. - Manasa Madhvaraj; Salvador Mir; Manuel J. Barragán (VLSI-SoC, 2022)

Innovative Practices Track: Innovative Analog Circuit Testing Technologies. - Chris Mangelsdorf; Manasa Madhvaraj; Salvador Mir; Manuel J. Barragán; Daisuke Iimori; Takayuki Nakatani; Shogo Katayama; Gaku Ogihara; Yujie Zhao; Jianglin Wei; Anna Kuwana; Kentaroh Katoh; et al. (VTS, 2022)

Special Session: On-chip jitter BIST with sub-picosecond resolution at GHz frequencies. - Manasa Madhvaraj; Salvador Mir; Manuel J. Barragán (LATS, 2023)

A sub-picosecond resolution jitter instrument for GHz frequencies based on a sub-sampling TDA. - Ankush Mamgain; Manasa Madhvaraj; Salvador Mir; Manuel J. Barragán; Jai Narayan Tripathi (NEWCAS, 2023)