Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs. - Sri Jandhyala; Hari Balachandran; Manidip Sengupta; Anura P. Jayasumana (VTS, 2000)

Application-specific worst case corners using response surfaces and statistical models. - Manidip Sengupta; Sharad Saxena; Lidia Daldoss; Glen Kramer; Sean Minehane; Jianjun Cheng (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2005)