SSFB: A highly-efficient and scalable simulation reduction technique for SRAM yield analysis. - Manish Rana; Ramon Canal (DATE, 2014)

REEM: Failure/non-failure region estimation method for SRAM yield analysis. - Manish Rana; Ramon Canal (ICCD, 2014)

SRAM memory margin probability failure estimation using Gaussian Process regression. - Manish Rana; Ramon Canal; Jie Han 001; Bruce F. Cockburn (ICCD, 2016)

Statistical analysis and comparison of 2T and 3T1D e-DRAM minimum energy operation. - Manish Rana; Ramon Canal; Esteve Amat; Antonio Rubio 001 (IOLTS, 2016)

Statistical analysis and design of subthreshold operation memories. - Manish Rana (2016)

Automatic Selection of Process Corner Simulations for Faster Design Verification. - Michael Shoniker; Oleg Oleynikov; Bruce F. Cockburn; Jie Han 001; Manish Rana; Witold Pedrycz (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018)