Data Analysis Techniques for CMOS Technology Characterization and Product Impact Assessment. - Anne Gattiker; Manjul Bhushan; Mark B. Ketchen (ITC, 2006)

Product-representative 'at speed' test structures for CMOS characterization. - Mark B. Ketchen; Manjul Bhushan (IBM J. Res. Dev., 2006)

An Integrated CAD Methodology for Evaluating MOSFET and Parasitic Extraction Models and Variability. - Koushik K. Das; Steven G. Walker; Manjul Bhushan (Proc. IEEE, 2007)