Thermal effect on dynamic Ron degradation of p-GaN AlGaN/GaN HEMTs on SiC substrates. - Manqing Hu; Gengxin Liu; E. Du; Feiyan Mu (IEICE Electron. Express, 2020)

Current injection: a hardware method of adapting non-ideal effects of ReRAM based deep learning accelerator. - Gengxin Liu; Manqing Hu; Yitian Zhang; E. Du; Dekang Liu (IEICE Electron. Express, 2020)

LaF: Lattice-Based and Communication-Efficient Federated Learning. - Peng Xu 003; Manqing Hu; Tianyang Chen; Wei Wang 088; Hai Jin 001 (IEEE Trans. Inf. Forensics Secur., 2022)