Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies. - Robert Madge; Manu Rehani; Kevin Cota; W. Robert Daasch (VTS, 2002)

Dude! Where's my data? - Cracking Open the Hermetically Sealed Tester. - W. Robert Daasch; Manu Rehani (ITC, 2004)

ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test. - Manu Rehani; David Abercrombie; Robert Madge; Jim Teisher; Jason Saw (ITC, 2004)