Electrical characterization of process induced effects on non-silicon devices. - Chadwin D. Young; Pavel Bolshakov; Rodolfo A. Rodriguez-Davila; Peng Zhao; Ava Khosravi; Israel Mejia; Manuel Quevedo-Lopez; Christopher L. Hinkle; Robert M. Wallace (ICICDT, 2018)

Positive Bias Instability in ZnO TFTs with Al2O3 Gate Dielectric. - Pavel Bolshakov; Rodolfo A. Rodriguez-Davila; Manuel Quevedo-Lopez; Chadwin D. Young (IRPS, 2019)

Enhanced Threshold Voltage Stability in ZnO Thin-Film-Transistors by Excess of Oxygen in Atomic Layer Deposited Al2O3. - Rodolfo A. Rodriguez-Davila; Richard A. Chapman; Massimo Catalano; Manuel Quevedo-Lopez; Chadwin D. Young (IRPS, 2020)

Reliability Assessment of a-IGZO and ZnO Thin Film Transistors (TFTs) to X-ray irradiation. - Rodolfo A. Rodriguez-Davila; L. Fernandez-Izquierdo; J. Fink; T. Moise; Robert C. Baumann; B. Gnade; Manuel Quevedo-Lopez; Chadwin D. Young (IRPS, 2024)

Investigation of the Impact of Hydrogen Defects on the VT shift in Back-Gate IGZO TFTs. - Mohammad Fathi; Md Abdullah Al Mamun; Rodolfo A. Rodriguez-Davila; Shumiya Alam; Jongchan Kim; Tanvir Haider Pantha; Milan Pesic; Manuel Quevedo-Lopez; Kyeongjae Cho; Sourav Dutta; Chadwin D. Young (IRPS, 2025)