Process Control and Failure Analysis Implementation for THz Schottky-based components. - V. Ichizli; Manuel Rodríguez-Gironés; L. Marchand; C. Garden; Oleg Cojocari; Bastian Mottet; Hans L. Hartnagel (Microelectron. Reliab., 2002)

Reliability investigations on HBV using pulsed electrical stress. - Cezary Sydlo; M. Saglam; Bastian Mottet; Manuel Rodríguez-Gironés; Hans L. Hartnagel (Microelectron. Reliab., 2002)

A novel system for systematic microwave noise and DC characterization of terahertz Schottky diodes. - Stephan Biber; Oleg Cojocari; Günther Rehm; Bastian Mottet; Manuel Rodríguez-Gironés; Lorenz-Peter Schmidt; Hans L. Hartnagel (IEEE Trans. Instrum. Meas., 2004)