Size dependence of hall mobility and dislocation density in Ge heteroepitaxial layers grown by MBE on a SiO2 patterned Si template. - Jooyoung Lee; Mao-Nan Chang; Kang L. Wang (Microelectron. J., 2006)

Investigations of photo-assisted conductive atomic force microscopy on III-nitrides. - Mao-Nan Chang; Ruo-Syuan Lin; Hsueh-Hsing Liu; Hung-Min Lin; Hung-Cheng Lin; Jen-Inn Chyi (Microelectron. J., 2009)

Localized two-step galvanic replacement of a tip apex modification for field sensitive scanning probe microscopy. - Chun-Ting Lin; Mao-Nan Chang; Yu-Wei Chen; Shu-Hung Tung; Nancy Chu; Chien-Nan Hsiao; Ming-Hua Shiao (NEMS, 2014)

A gold nano-dot modified silicon tip apex for scanning Kelvin probe microscopy. - Chun-Ting Lin; Ching-Hao Chen; Chien-Ting Wu; Chien-Nan Hsiao; Ming-Hua Shiao; Mao-Nan Chang (NEMS, 2015)