Robust DfT Techniques for Built-in Fault Detection in Operational Amplifiers with High Coverage. - Marampally Saikiran; Mona Ganji; Degang Chen 001 (ITC, 2020)

All Digital Low-Cost Built-in Defect Testing Strategy for Operational Amplifiers with High Coverage. - Michael Sekyere; Marampally Saikiran; Degang Chen 001 (IOLTS, 2022)

A Wide-Range Low-cost Temperature to Digital Converter Independent of Device Models. - Mona Ganji; Marampally Saikiran; Degang Chen 001 (ISCAS, 2022)

Robust Built-in Defect-Detection for Low Drop-Out Regulators using Digital Mismatch Injection. - Marampally Saikiran; Mona Ganji; Degang Chen 001 (ISCAS, 2022)

A Time-Efficient Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits. - Marampally Saikiran; Mona Ganji; Degang Chen 001 (SBCCI, 2022)

Digital Defect-Oriented Test Methodology for Flipped Voltage Follower Low Dropout (LDO) Voltage Regulators. - Marampally Saikiran; Mona Ganji; Degang Chen 001 (SBCCI, 2022)

All Digital Low-Overhead SAR ADC Built-In Self-Test for Fault Detection and Diagnosis. - Mona Ganji; Marampally Saikiran; Degang Chen 001 (VTS, 2022)

Systematic Methodology to Design High Precision Voltage References with Sub-ppm/°C Temperature Coefficient. - Vijayalakshmi Naganadhan; Marampally Saikiran; Mahmoud Gshash; Degang Chen 001 (EWDTS, 2023)

Digital Assisted Defect Detection Methods for Analog and Mixed Signal Circuits: An Overview. - Marampally Saikiran; Michael Sekyere; Mona Ganji; Degang Chen 001 (EWDTS, 2023)

Graph Theory Based Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Improved Time-Efficiency. - Marampally Saikiran; Michael Sekyere; Mona Ganji; Degang Chen 001 (EWDTS, 2023)

A Power Supply Rejection Based Approach for Robust Defect Detection in Operational Amplifiers. - Michael Sekyere; Marampally Saikiran; Degang Chen 001 (EWDTS, 2023)

Digital Defect Oriented Test Method for Phase Locked Loops with High Coverage. - Michael Sekyere; Marampally Saikiran; Godfred Bonsu; Kelvin W. Tamakloe; Rob Butler; Reed Adams; Degang Chen 001 (I2MTC, 2025)

Signal Flow Graph Analysis of Analog Circuits using Principles of Control Theory : Tutorial Review. - Michael Sekyere; Marampally Saikiran; Degang Chen 001 (ISCAS, 2025)

Robust Defect Detection for Phase-Locked Loops using All-Digital Built-In Self-Test (BIST) Circuitry. - Michael Sekyere; Marampally Saikiran; Rob Butler; Reed Adams; Degang Chen 001 (ISCAS, 2025)