Statistical aspects of the degradation of LDD nMOSFETs. - E. Andries; R. Dreesen; Kris Croes; Ward De Ceuninck; Luc De Schepper; Guido Groeseneken; K. F. Lo; Marc D'Olieslaeger; Jan D'Haen (Microelectron. Reliab., 2002)

High-resolution SILC measurements of thin SiO2 at ultra low voltages. - Stefano Aresu; Ward De Ceuninck; R. Dreesen; Kris Croes; E. Andries; Jean Manca; Luc De Schepper; Robin Degraeve; Ben Kaczer; Marc D'Olieslaeger (Microelectron. Reliab., 2002)

Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology. - R. Petersen; Ward De Ceuninck; Jan D'Haen; Marc D'Olieslaeger; Luc De Schepper; Olivier Vendier; Hervé Blanck; Dominique Pons (Microelectron. Reliab., 2002)

A new method for the analysis of high-resolution SILC data. - Stefano Aresu; Ward De Ceuninck; G. Knuyt; J. Mertens; Jean Manca; Luc De Schepper; Robin Degraeve; Ben Kaczer; Marc D'Olieslaeger; Jan D'Haen (Microelectron. Reliab., 2003)

MTF test system with AC based dynamic joule correction for electromigration tests on interconnects. - Leen Biesemans; K. Schepers; Kris Vanstreels; Jan D'Haen; Ward De Ceuninck; Marc D'Olieslaeger (Microelectron. Reliab., 2004)

A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structure. - Kris Vanstreels; Marc D'Olieslaeger; Ward De Ceuninck; Jan D'Haen; Karen Maex (Microelectron. Reliab., 2005)