Special session on machine learning: How will machine learning transform test? - Yiorgos Makris; Amit Nahar; Haralampos-G. D. Stratigopoulos; Marc Hutner (VTS, 2018)

Innovative Practices on In-System Test and Reliability of Memories. - S. Bandyopadhyay; J. Mekkoth; Marc Hutner; Hayk T. Grigoryan; Arun Kumar; Samvel K. Shoukourian; Grigor Tshagharyan; Yervant Zorian; Gabriele Boschi; Duccio Lazzarotti; Donato Luongo; Hanna Shaheen; et al. (VTS, 2019)

Special Session: Test Challenges in a Chiplet Marketplace. - Marc Hutner; R. Sethuram; Bapi Vinnakota; Dave Armstrong; A. Copperhall (VTS, 2020)

The Advancement of 1149.10. - Yu Huang; Haitao Fu; Bin Deng; Edward Seng; Marc Hutner; Jean-Francois Cote; Geir Eide (ITC-Asia, 2021)

Applying Universal Chip Telemetry to Detect Latent Defects and Aging in Advanced Electronics. - Evelyn Landman; Alex Burlak; C. Nir Sever; Marc Hutner (IRPS, 2022)