Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue. - B. Khong; Patrick Tounsi; Philippe Dupuy; X. Chauffleur; Marc Legros; A. Deram; Colette Levade; G. Vanderschaeve; Jean-Marie Dorkel; Jean-Pierre Fradin (Microelectron. Reliab., 2005)

Characterization and modelling of ageing failures on power MOSFET devices. - B. Khong; Marc Legros; Patrick Tounsi; Philippe Dupuy; X. Chauffleur; Colette Levade; G. Vanderschaeve; Emmanuel Scheid (Microelectron. Reliab., 2007)

Characterization of ageing failures on power MOSFET devices by electron and ion microscopies. - Donatien Martineau; Thomas Mazeaud; Marc Legros; Philippe Dupuy; Colette Levade; G. Vanderschaeve (Microelectron. Reliab., 2009)

Characterization of alterations on power MOSFET devices under extreme electro-thermal fatigue. - Donatien Martineau; Thomas Mazeaud; Marc Legros; Philippe Dupuy; Colette Levade (Microelectron. Reliab., 2010)

Universal mechanisms of Al metallization ageing in power MOSFET devices. - Donatien Martineau; Colette Levade; Marc Legros; Philippe Dupuy; Thomas Mazeaud (Microelectron. Reliab., 2014)

In-depth investigation of metallization aging in power MOSFETs. - R. Ruffilli; Mounira Berkani; Philippe Dupuy; Stéphane Lefebvre; Y. Weber; Marc Legros (Microelectron. Reliab., 2015)

Mechanisms of power module source metal degradation during electro-thermal aging. - R. Ruffilli; Mounira Berkani; Philippe Dupuy; Stéphane Lefebvre; Y. Weber; Marc Legros (Microelectron. Reliab., 2017)

Instance Segmentation of Dislocations in TEM Images. - Karina Ruzaeva; Kishan Govind; Marc Legros; Stefan Sandfeld (CoRR, 2023)

Deep learning of crystalline defects from TEM images: a solution for the problem of 'never enough training data'. - Kishan Govind; Daniela Oliveros; Antonin Dlouhy; Marc Legros; Stefan Sandfeld (Mach. Learn. Sci. Technol., 2024)