Effect of ions presence in the SiOCH inter metal dielectric structure. - Benjamin Rebuffat; Vincenzo Della Marca; Pascal Masson; Jean-Luc Ogier; Marc Mantelli; Olivier Paulet; Laurent Lopez; Romain Laffont (ESSDERC, 2013)

Effect of AC stress on oxide TDDB and trapped charge in interface states. - Benjamin Rebuffat; Pascal Masson; Jean-Luc Ogier; Marc Mantelli; Romain Laffont (ISIC, 2014)

Circuit-level evaluation of a new zero-cost transistor in an embedded non-volatile memory CMOS technology. - Paul Devoge; Hassen Aziza; Philippe Lorenzini; Franck Julien; Abderrezak Marzaki; Alexandre Malherbe; Marc Mantelli; Thomas Sardin; Sébastien Haendler; Arnaud Régnier; Stephan Niel (DTIS, 2021)

Hot Electron Source Side Injection Comprehension in 40nm eSTM™. - Franck Melul; Thibault Kempf; Vincenzo Della Marca; Marc Bocquet; Madjid Akbal; Frederique Trenteseaux; Marc Mantelli; Arnaud Régnier; Stephan Niel; Francesco La Rosa (IMW, 2021)

40nm SONOS Embedded Select in Trench Memory. - Radouane Habhab; Vincenzo Della Marca; Pascal Masson; Nadia Miridi; Clement Pribat; Simon Jeannot; Thibault Kempf; Marc Mantelli; Philippe Lorenzini; Jean-Marc Voisin; Arnaud Régnier; Stephan Niel; et al. (ESSDERC, 2023)