Characterization of the self-heating of AlGaN/GaN HEMTs during an electrical stress by using Raman spectroscopy. - Fanny Berthet; Yannick Guhel; Hamid Gualous; Bertrand Boudart; Jean-Lionel Trolet; Marc Piccione; Christophe Gaquière (Microelectron. Reliab., 2011)

Total ionising dose effects on punch-through insulated gate bipolar transistors turn-on switching behaviour. - Boubekeur Tala-Ighil; Amrane Oukaour; Hamid Gualous; Bertrand Boudart; Bertrand Pouderoux; Jean-Lionel Trolet; Marc Piccione (Microelectron. Reliab., 2011)

Annihilation of electrical trap effects by irradiating AlGaN/GaN HEMTs with low thermal neutrons radiation fluence. - Fanny Berthet; Yannick Guhel; Hamid Gualous; Bertrand Boudart; Jean-Lionel Trolet; Marc Piccione; Christophe Gaquière (Microelectron. Reliab., 2012)