Physical DFT for High Coverage of Realistic Faults. - M. Saraiva; P. Casimiro; Marcelino B. Santos; José T. de Sousa; Fernando M. Gonçalves; Isabel C. Teixeira; João Paulo Teixeira 001 (ITC, 1992)

On the design of a highly testable cell library. - M. Saraiva; Marcelino B. Santos; A. P. Casimiro; Isabel Maria Cacho Teixeira; João Paulo Teixeira 001 (Microprocess. Microprogramming, 1992)

Experiments on Bridging Fault Analysis and Layout-Level DFT for CMOS Designs. - A. P. Casimiro; M. Simões; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (DFT, 1993)

Realistic Fault Analysis of CMOS Analog Building Blocks. - P. Nicolau; J. Barbosa; M. Saraiva; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (DFT, 1993)

On the Analysis of Routing Cells and Adjacency Faults in CMOS Digital Circuits. - A. P. Casimiro; Fernando M. Gonçalves; João Paulo Teixeira 001; Marcelino B. Santos (DFT, 1994)

Back Annotation of Physical Defects into Gate-Level, Realistic Faults in Digital ICs. - Mario Calha; Marcelino B. Santos; Fernando M. Gonçalves; Isabel C. Teixeira; João Paulo Teixeira 001 (ITC, 1994)

Test preparation methodology for high coverage of physical defects in CMOS digital ICs. - Marcelino B. Santos; M. Simões; Isabel C. Teixeira; João Paulo Teixeira 001 (ED&TC, 1995)

Test preparation for high coverage of physical defects in CMOS digital ICs. - Marcelino B. Santos; M. Simões; Isabel C. Teixeira; João Paulo Teixeira 001 (VTS, 1995)

VHDL fault simulation for defect-oriented test and diagnosis of digital ICs. - João Paulo Teixeira 001; F. Celeiro; L. Dias; J. Ferreira; Marcelino B. Santos (EURO-DAC, 1996)

Defect-Oriented IC Test and Diagnosis Using VHDL Fault Simulation. - F. Celeiro; L. Dias; J. Ferreira; Marcelino B. Santos; João Paulo Teixeira 001 (ITC, 1996)

Defect-oriented testing of analogue and mixed signal ICs. - Marcelino B. Santos; Fernando M. Gonçalves; Michael J. Ohletz; João Paulo Teixeira 001 (ICECS, 1998)

Defect-oriented test quality assessment using fault sampling and simulation. - Fernando M. Gonçalves; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (ITC, 1998)

Defect-Oriented Mixed-Level Fault Simulation of Digital Systems-on-a-Chip Using HDL. - Marcelino B. Santos; João Paulo Teixeira 001 (DATE, 1999)

From system level to defect-oriented test: a case study. - Octávio Páscoa Dias; Jorge Semião; Marcelino B. Santos; Isabel Maria Cacho Teixeira; João Paulo Teixeira 001 (ETW, 1999)

Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity. - Patrick Girard 001; Loïs Guiller; Christian Landrault; Serge Pravossoudovitch; Joan Figueras; Salvador Manich; João Paulo Teixeira 001; Marcelino B. Santos (ISCAS (1), 1999)

Defect-Oriented Verilog Fault Simulation of SoC Macros using a Stratified Fault Sampling Technique. - Marcelino B. Santos; Fernando M. Gonçalves; Isabel C. Teixeira; João Paulo Teixeira 001 (VTS, 1999)

RTL-based functional test generation for high defects coverage in digital SOCs. - Marcelino B. Santos; Fernando M. Gonçalves; Isabel C. Teixeira; João Paulo Teixeira 001 (ETW, 2000)

Quality of Electronic Design: From Architectural Level to Test Coverage. - Octávio Páscoa Dias; Jorge Semião; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (ISQED, 2000)

Experiments on RTL ATPG and Fault Simulation for High Defect Coverage in Digital Systems-on-a-Chip. - Marcelino B. Santos; João Paulo Teixeira 001 (LATW, 2000)

Low Power BIST by Filtering Non-Detecting Vectors. - Salvador Manich; A. Gabarró; M. Lopez; Joan Figueras; Patrick Girard 001; Loïs Guiller; Christian Landrault; Serge Pravossoudovitch; João Paulo Teixeira 001; Marcelino B. Santos (J. Electron. Test., 2000)

Design and Test of Certifiable ASICs for Safety-Critical Gas Burners Contro. - Fernando M. Gonçalves; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (IOLTW, 2001)

Implicit functionality and multiple branch coverage (IFMB): a testability metric for RT-level. - Fernando M. Gonçalves; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (ITC, 2001)

RTL-Based Functional Test Generation for High Defects Coverage in Digital Systems. - Marcelino B. Santos; Fernando M. Gonçalves; Isabel C. Teixeira; João Paulo Teixeira 001 (J. Electron. Test., 2001)

Self-Checking and Fault Tolerance Quality Assessment Using Fault Sampling. - Fernando M. Gonçalves; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (DFT, 2002)

RTL Level Preparation of High-Quality/Low-Energy/Low-Power BIST. - Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001; Salvador Manich; Rosa Rodríguez-Montañés; Joan Figueras (ITC, 2002)

On High-Quality, Low Energy BIST Preparation at RT-Level. - Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001; Salvador Manich; Luz Balado; Joan Figueras (LATW, 2002)

Design and Test of a Certifiable ASIC for a Safety-Critical Gas Burner Control System. - Fernando M. Gonçalves; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (J. Electron. Test., 2002)

RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage. - Marcelino B. Santos; Fernando M. Gonçalves; Isabel C. Teixeira; João Paulo Teixeira 001 (J. Electron. Test., 2002)

RTL Test Pattern Generation for High Quality Loosely Deterministic BIST. - Marcelino B. Santos; José M. Fernandes; Isabel C. Teixeira; João Paulo Teixeira 001 (DATE, 2003)

Fault Simulation Using Partially Reconfigurable Hardware. - Abilio Parreira; João Paulo Teixeira 001; A. Pantelimon; Marcelino B. Santos; José T. de Sousa (FPL, 2003)

Property Coverage for Quality Assessment of Fault Tolerant or Fail Safe Systems. - Fernando M. Gonçalves; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (IOLTS, 2003)

A Probabilistic Method for the Computation of Testability of RTL Constructs. - José M. Fernandes; Marcelino B. Santos; Arlindo L. Oliveira; João Paulo Teixeira 001 (DATE, 2004)

FPGAs BIST Evaluation. - Abilio Parreira; João Paulo Teixeira 001; Marcelino B. Santos (FPL, 2004)

Modeling and Simulation of Time Domain Faults in Digital Systems. - Daniel Barros Jr.; Fabian Vargas 001; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (IOLTS, 2004)

Built-In Self-Test Quality Assessment Using Hardware Fault Emulation In FPGAs. - Abilio Parreira; João Paulo Teixeira 001; Marcelino B. Santos (Comput. Artif. Intell., 2004)

On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level. - Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001; Salvador Manich; Luz Balado; Joan Figueras (J. Electron. Test., 2004)

Dynamic Fault Test and Diagnosis in Digital Systems Using Multiple Clock Schemes and Multi-VDD Test. - Marcial Jesús Rodríguez-Irago; Juan J. Rodríguez-Andina; Fabian Vargas 001; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (IOLTS, 2005)

Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip. - D. Barros Júnior; Marcial Jesús Rodríguez-Irago; Marcelino B. Santos; Isabel C. Teixeira; Fabian Vargas 001; João Paulo Teixeira 001 (J. Electron. Test., 2005)

Probabilistic Testability Analysis and DFT Methods at RTL. - José M. Fernandes; Marcelino B. Santos; Arlindo L. Oliveira; João Paulo Teixeira 001 (DDECS, 2006)

Functional-Oriented BIST of Sequential Circuits Aiming at Dynamic Faults Coverage. - F. Guerreiro; Jorge Semião; A. Pierce; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (DDECS, 2006)

DFT and Probabilistic Testability Analysis at RTL. - José M. Fernandes; Marcelino B. Santos; Arlindo L. Oliveira; João Paulo Cacho Teixeira (HLDVT, 2006)

BIST Architectures and Fault Emulation. - Abilio Parreira; Marcelino B. Santos; João Paulo Teixeira 001 (LATW, 2006)

Improving Tolerance to Power-Supply and Temperature Variations in Synchronous Circuits. - Jorge Semião; Judit Freijedo; Juan J. Rodríguez-Andina; Fabian Vargas 001; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (DDECS, 2007)

Improving the Tolerance of Pipeline Based Circuits to Power Supply or Temperature Variations. - Jorge Semião; Juan J. Rodríguez-Andina; Fabian Vargas 001; Marcelino Bicho Dos Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (DFT, 2007)

On-line Dynamic Delay Insertion to Improve Signal Integrity in Synchronous Circuits. - Jorge Semião; Judit Freijedo; Juan J. Rodríguez-Andina; Fabian Vargas 001; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (IOLTS, 2007)

Enhancing the Tolerance to Power-Supply Instability in Digital Circuits. - Jorge Semião; Judit Freijedo; Juan J. Rodríguez-Andina; Fabian Vargas 001; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (ISVLSI, 2007)

Functional-oriented mask-based built-in self-test. - Marcelino B. Santos; João Paulo Teixeira 001 (IET Comput. Digit. Tech., 2007)

Adjustable low consumption circuit for monitorization of power source voltages in a SoC. - Rodrigo Duarte; Júlio Paisana; Marcelino B. Santos; Floriberto A. Lima (APCCAS, 2008)

Process Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits. - Jorge Semião; Juan J. Rodríguez-Andina; Fabian Vargas 001; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (DDECS, 2008)

Exploiting Parametric Power Supply and/or Temperature Variations to Improve Fault Tolerance in Digital Circuits. - Jorge Semião; Judit Freijedo; Juan J. Rodríguez-Andina; Fabian Vargas 001; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (IOLTS, 2008)

Monolithic Multi-mode DC-DC Converter with Gate Voltage Optimization. - Nuno Dias; Marcelino B. Santos; Floriberto A. Lima; Beatriz Vieira Borges; Júlio Paisana (PATMOS, 2008)

Signal Integrity Enhancement in Digital Circuits. - Jorge Semião; Marcial Jesús Rodríguez-Irago; Juan J. Rodríguez-Andina; Leonardo Bisch Piccoli; Fabian Vargas 001; Marcelino Bicho Dos Santos; Isabel Maria Cacho Teixeira; João Paulo Teixeira 001 (IEEE Des. Test Comput., 2008)

Time Management for Low-Power Design of Digital Systems. - Jorge Semião; Judit Freijedo; Juan J. Rodríguez-Andina; Fabian Vargas 001; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (J. Low Power Electron., 2008)

Level Shifters and DCVSL for a Low-Voltage CMOS 4.2-V Buck Converter. - José F. da Rocha; Marcelino Bicho Dos Santos; José M. Dores Costa; Floriberto A. Lima (IEEE Trans. Ind. Electron., 2008)

Controllability and observability in mixed signal cores. - José F. da Rocha; Nuno Dias; Angelo Monteiro; Alexandre Neves; Gabriel Santos; Marcelino B. Santos; João Paulo Teixeira 001 (IOLTS, 2009)

Delay-fault tolerance to power supply Voltage disturbances analysis in nanometer technologies. - Jorge Semião; Judit Freijedo; Juan J. Rodríguez-Andina; Fabian Vargas 001; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (IOLTS, 2009)

Built-in aging monitoring for safety-critical applications. - Julio César Vázquez; Víctor H. Champac; Adriel Ziesemer; Ricardo Reis 001; Isabel C. Teixeira; Marcelino B. Santos; João Paulo Teixeira 001 (IOLTS, 2009)

Measuring clock-signal modulation efficiency for Systems-on-Chip in electromagnetic interference environment. - Jorge Semião; Judit Freijedo; Marlon Moraes; M. Mallmann; Carlos Lemos Antunes; Juliano Benfica; Fabian Vargas 001; Marcelino B. Santos; Isabel C. Teixeira; Juan J. Rodríguez-Andina; João Paulo Teixeira 001; Daniel Lupi; et al. (LATW, 2009)

Gate Driver Voltage Optimization for Multi-Mode Low Power DC-DC Conversion. - Nuno Dias; Marcelino B. Santos; Angelo Monteiro; Pedro Braga; Alexandre Neves (J. Low Power Electron., 2009)

Noise Minimization for Low Power Bandgap Reference and Low Dropout Regulator Cores. - Angelo Monteiro; Marcelino B. Santos; Alexandre Neves; Nuno Dias (J. Low Power Electron., 2009)

Programmable aging sensor for automotive safety-critical applications. - Julio César Vázquez; Víctor H. Champac; Isabel C. Teixeira; Marcelino B. Santos; João Paulo Teixeira 001 (DATE, 2010)

Predictive error detection by on-line aging monitoring. - Julio César Vázquez; Víctor H. Champac; Adriel Ziesemer; Ricardo Reis 001; Jorge Semião; Isabel C. Teixeira; Marcelino B. Santos; João Paulo Teixeira 001 (IOLTS, 2010)

Low-sensitivity to process variations aging sensor for automotive safety-critical applications. - Julio César Vázquez; Víctor H. Champac; Adriel Ziesemer; Ricardo Reis 001; Isabel Maria Cacho Teixeira; Marcelino B. Santos; João Paulo Teixeira 001 (VTS, 2010)

Mixed-Signal Fault Equivalence: Search and Evaluation. - Nuno Guerreiro; Marcelino B. Santos (Asian Test Symposium, 2011)

Digital LQR control with Kalman Estimator for DC-DC Buck converter. - Carlos O. Moreira; J. Fernando A. da Silva; Sónia Ferreira Pinto; Marcelino B. Santos (EUROCON, 2011)

Analysis of a monolithic buck converter's pMOS switch during turn off. - José F. da Rocha; Marcelino Bicho Dos Santos; José M. Dores Costa (EUROCON, 2011)

ICT: Interface software for the characterization and test of mixed-signal power cores. - Jorge O. M. Esteves; Tiago H. Moita; Carlos B. Almeida; Marcelino B. Santos (IOLTS, 2011)

On-line BIST for performance failure prediction under aging effects in automotive safety-critical applications. - R. S. Oliveira; Jorge Semião; Isabel C. Teixeira; Marcelino B. Santos; João Paulo Teixeira 001 (LATW, 2011)

Adaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors. - Celestino V. Martins; Jorge Semião; Julio César Vázquez; Víctor H. Champac; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (VTS, 2011)

Digital Sliding Mode Control of DC-DC Buck Converters. - Bruno Jacinto; Carlos Moreira; Marcelino B. Santos (J. Low Power Electron., 2011)

On-Line BIST for Performance Failure Prediction Under NBTI-Induced Aging in Safety-Critical Applications. - R. S. Oliveira; Jorge Semião; Isabel C. Teixeira; Marcelino B. Santos; João Paulo Teixeira 001 (J. Low Power Electron., 2011)

Smart Control of Internal Supply Voltage Spikes in a Low Voltage DC-DC Buck Converter. - José F. da Rocha; Marcelino Bicho Dos Santos; José M. Dores Costa (J. Low Power Electron., 2011)

An ultra-low noise current source for magnetoresistive biosensors biasing. - Tiago L. Costa; Moisés Simões Piedade; Marcelino B. Santos (BioCAS, 2012)

The influence of clock-gating on NBTI-induced delay degradation. - Jackson Pachito; Celestino V. Martins; Jorge Semião; Marcelino Bicho Dos Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (IOLTS, 2012)

Aging-Aware Power or Frequency Tuning With Predictive Fault Detection. - Jackson Pachito; Celestino V. Martins; Bruno Jacinto; Jorge Semião; Julio César Vázquez; Víctor H. Champac; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (IEEE Des. Test Comput., 2012)

Modeling of Inherent Losses of Fully Integrated Switched Capacitor DC-DC Converters. - Valter Sádio; Fabian Rein; Christian Münker; Marcelino B. Santos (J. Low Power Electron., 2012)

Aging monitoring with local sensors in FPGA-based designs. - Carlos Leong; Jorge Semião; Isabel C. Teixeira; Marcelino B. Santos; João Paulo Teixeira 001; María Dolores Valdés; Judit Freijedo; Juan J. Rodríguez-Andina; Fabian Vargas 001 (FPL, 2013)

A self-calibrated 10-bit 1 MSps SAR ADC with reduced-voltage charge-sharing DAC. - Taimur Gibran Rabuske; Jorge R. Fernandes; Fabio Gibran Rabuske; Cesar Ramos Rodrigues; Marcelino Bicho Dos Santos (ISCAS, 2013)

Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion. - Julio César Vázquez; Víctor H. Champac; Jorge Semião; Isabel C. Teixeira; Marcelino B. Santos; João Paulo Teixeira 001 (J. Electron. Test., 2013)

ActivIC: Design-Based Automatic Characterization of Mixed-Signal Integrated Circuits. - Tiago H. Moita; Carlos B. Almeida; Marcelino Bicho Dos Santos (J. Low Power Electron., 2013)

Ultra low power capless LDO with dynamic biasing of derivative feedback. - Jorge O. M. Esteves; João Pereira; Júlio Paisana; Marcelino B. Santos (Microelectron. J., 2013)

Performance sensor for tolerance and predictive detection of delay-faults. - Jorge Semião; David Saraiva; Carlos Leong; André Romão; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (DFT, 2014)

Implicit current DC-DC Digital Voltage-Mode Control. - Carlos Moreira; Marcelino B. Santos (ISIE, 2014)

Digital modular control of high frequency DC-DC converters. - Abilio Parreira; Floriberto A. Lima; Marcelino B. Santos (Microelectron. J., 2014)

Fault-tolerance in FPGA focusing power reduction or performance enhancement. - Carlos Leong; Jorge Semião; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (LATS, 2015)

Fault-Tolerance in Field Programmable Gate Array with Dynamic Voltage and Frequency Scaling. - Carlos Leong; Jorge Semião; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (J. Low Power Electron., 2015)

Low-power frequency monitoring circuit for clock failure detection. - Rodrigo B. Capeleiro; José M. Leitão; Ricardo Chaves; Marcelino B. Santos (DCIS, 2018)

Low noise, high efficiency, segmented LCD drivers for ultra-low power applications in 22 nm FD-SOI. - Rodrigo B. Capeleiro; Marcelino B. Santos (DCIS, 2018)

Performance Sensor for Reliable Operation. - Jorge Semião; Ruben Cabral; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (HCI (8), 2018)

Applying Model Checking in the Verification of a Clock Masking Unit. - José M. Leitão; Ricardo Chaves; Marcelino B. Santos (DCIS, 2019)

Internet of Things and Artificial Intelligence - A Wining Partnership? - Jorge Semião; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (Convergence of Artificial Intelligence and the Internet of Things, 2020)

SRAM Performance Sensor. - Jorge Semião; Luís Santos; Marcelino B. Santos (DCIS, 2021)

Asynchronous Controller Design and Simulation Using Signal Transition Graphs. - Diogo Domingos; Marcelino B. Santos (DCIS, 2022)

Load Optimized Gate Driving for Charge Pumps. - Carlos Santos; Jorge R. Fernandes; Marcelino B. Santos (DCIS, 2022)

DRAM Performance Sensor. - Jorge Semião; Luís Santos; Marcelino B. Santos (HCI (7), 2022)

Delta-Sigma Control Loop For Energy-Efficient Electrical Stimulation with Arbitrary-Shape Stimuli. - Amin Rashidi; Hassan Rivandi; Milos Grubor; André Agostinho; Valter Sádio; Marcelino B. Santos; Wouter A. Serdijn; Vasiliki Giagka (BioCAS, 2023)

Paving the Way for the Electronic Design Automation of Power Management Units. - Carlos Santos; Jorge R. Fernandes; Marcelino B. Santos; Ricardo Martins (SMACD, 2023)

A Small-Area Current-Mode Input ΣΔ Modulator for Under-the-Sensors ADC Arrays. - Hanna Iva Busse; Taimur Gibran Rabuske; Mário Silva 002; Gonçalo Rodrigues; Diogo Miguel Caetano; Marcelino B. Santos; Jorge R. Fernandes (DCIS, 2024)

WIP: Building an Education Ecosystem for Next Generation Microelectronics Experts in Green and Circular Economy with Digitally-Supported Teaching Methods for Sustainable Chips and Applications (EU Project GreenChips-EDU). - Klaus Hofmann; Ferdinand Keil; David Riehl; Alicja Michalowska-Forsyth; Nikolaus Czepl; Sarah Woywod; Dominik Zupan; Mario R. Casu; Carlo Ricciardi; Massimo Violante; Mariagrazia Graziano; Yuri Ardesi; et al. (FIE, 2024)

Integrated Demodulator for Manchester-Coded AM Signals with Clock Retrieval in US Applications. - Hanna Iva Busse; Gonçalo Rodrigues; Diogo Miguel Caetano; Marcelino B. Santos; Jorge R. Fernandes (MWSCAS, 2024)

An Ultra Low Power Circuits M.Sc. Course Proposal for the GreenChips-EDU Platform. - Jorge R. Fernandes; Ricardo Martins; Gonçalo Rodrigues; Marcelino B. Santos (ISCAS, 2025)

A 0.5V Programmable Voltage Reference with Integrated Differential-Pair Trimming achieving 28.1ppm/°C Temperature Coefficient. - Diogo Ralo; Valter Sádio; Fábio Passos; Tiago H. Moita; Marcelino B. Santos (ISCAS, 2025)

On the Usage of Genetic Algorithms, Reinforcement Learning and Bayesian Optimisation for RF IC Design Automation. - Margarida Lourenço; Bingbing Zhao; Junde Li; Marcelino B. Santos; Pui-In Mak; Rui Paulo Martins; Wei-Han Yu; Fábio Passos (SMACD, 2025)

Technology-independent Layout Generator of Industry-grade Power Devices Validated Down to 22-nm Nodes. - Duarte Marques; Ricardo Martins; Marcelino B. Santos (SMACD, 2025)

Incorporation of Piezoelectric Materials in Military Uniforms. - Rodrigues de Fátima Jacinto; Ricardo A. Marques Lameirinhas; Catarina P. Correia V. Bernardo; João Paulo N. Torres 001; Pedro Mendonça dos Santos; Marcelino B. Santos; Antonio Baptista (IEEE Access, 2025)