Investigation on VTH and RON Slow/Fast Drifts in SiC MOSFETs. - Marcello Cioni; Alessandro Bertacchini; Alessandro Mucci; Giovanni Verzellesi; Paolo Pavan; Alessandro Chini (IRPS, 2021)

A Novel Temperature Estimation Technique Exploiting Carrier Emission from Buffer Traps. - Marcello Cioni; Nicolò Zagni; Alessandro Chini (ESSDERC, 2022)

Identification of Interface States responsible for VTH Hysteresis in packaged SiC MOSFETs. - Marcello Cioni; Patrick Fiorenza; Fabrizio Roccaforte; Mario Saggio; Salvatore Cascino; Angelo Alberto Messina; Vincenzo Vinciguerra; Michele Calabretta; Alessandro Chini (IRPS, 2022)

Fe-Traps Influence on Time-dependent Breakdown Voltage in 0.1-μm GaN HEMTs for 5G Applications. - Marcello Cioni; Nicolò Zagni; Alessandro Chini (IRPS, 2022)

Evidence of Carbon Doping Effect on VTH Drift and Dynamic-RON of 100V p-GaN Gate AlGaN/GaN HEMTs. - Marcello Cioni; G. Giorgino; Alessandro Chini; Carmine Miccoli; Maria Eloisa Castagna; M. Moschetti; C. Tringali; Ferdinando Iucolano (IRPS, 2023)