On the Design of Self-Checking Boundary Scannable Boards. - Marcelo Lubaszewski; Bernard Courtois (ITC, 1992)

Unifying test and diagnosis of interconnects and logic clusters in partial boundary scan boards. - Meryem Marzouki; Marcelo Lubaszewski; Mohamed Hedi Touati (ICCAD, 1993)

Built-in self-test and fault diagnosis of fully differential analogue circuits. - Salvador Mir; Vladimir Kolarik; Marcelo Lubaszewski; C. Nielsen; Bernard Courtois (ICCAD, 1994)

Designing self-exercising analogue checkers. - Vladimir Kolarik; Marcelo Lubaszewski; Bernard Courtois (VTS, 1994)

Mixed-signal circuits and boards for high safety applications. - Marcelo Lubaszewski; Vladimir Kolarik; Salvador Mir; C. Nielsen; Bernard Courtois (ED&TC, 1995)

Frequency-based BIST for analog circuit testin. - Khaled Saab 001; Bozena Kaminska; Bernard Courtois; Marcelo Lubaszewski (VTS, 1995)

Analog checkers with absolute and relative tolerances. - Vladimir Kolarik; Salvador Mir; Marcelo Lubaszewski; Bernard Courtois (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995)

Thermal Monitoring Of Safety-Critical Integrated Systems. - Vladimír Székely; Márta Rencz; Jean-Michel Karam; Marcelo Lubaszewski; Bernard Courtois (Asian Test Symposium, 1996)

Automatic Test Generation for Maximal Diagnosis of Linear Analogue Circuits. - Salvador Mir; Bernard Courtois; Marcelo Lubaszewski; Vladimir Kolarik (ED&TC, 1996)

ABILBO: Analog BuILt-in Block Observer. - Marcelo Lubaszewski; Salvador Mir; Leandro Pulz (ICCAD, 1996)

Design of high-performance band-pass sigma-delta modulator with concurrent error detection. - Fabrizio Francesconi; Valentino Liberali; Marcelo Lubaszewski; Salvador Mir (ICECS, 1996)

Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets. - Salvador Mir; Marcelo Lubaszewski; Bernard Courtois (J. Electron. Test., 1996)

Unified built-in self-test for fully differential analog circuits. - Salvador Mir; Marcelo Lubaszewski; Bernard Courtois (J. Electron. Test., 1996)

A CAT Tool for Frequency-domain Testing and Diagnosis on Analog. - Érika F. Cota; José Di Elias Domênico; Marcelo Lubaszewski (J. Braz. Comput. Soc., 1997)

Bridging the Gap between Microelectronics and Micromechanics Testing. - Marcelo Lubaszewski (Asian Test Symposium, 1998)

An Approach to the On-Line Testing of Operational Amplifiers. - Jaime Velasco-Medina; Marcelo Lubaszewski; Michael Nicolaidis (Asian Test Symposium, 1998)

Microsystems Testing: an Approach and Open Problems. - Marcelo Lubaszewski; Érika F. Cota; Bernard Courtois (DATE, 1998)

A Built-In Multi-Mode Stimuli Generator for Analogue and Mixed-Signal Testing. - Marcelo Lubaszewski; Michel Renovell; Salvador Mir; Florence Azaïs; Yves Bertrand (SBCCI, 1998)

Testing MEMS. - Jean-Michel Karam; Marcelo Lubaszewski; R. D. Shawn Blanton; Andrew Richardson 001 (VTS, 1998)

Thermal Monitoring of Self-Checking Systems. - Vladimír Székely; Márta Rencz; Jean-Michel Karam; Marcelo Lubaszewski; Bernard Courtois (J. Electron. Test., 1998)

A Reliable Fail-Safe System. - Marcelo Lubaszewski; Bernard Courtois (IEEE Trans. Computers, 1998)

A Method to Diagnose Faults in Linear Analog Circuits using an Adaptive Tester. - Érika F. Cota; Luigi Carro; Marcelo Lubaszewski (DATE, 1999)

Fault modeling of suspended thermal MEMS. - Benoît Charlot; Salvador Mir; Érika F. Cota; Marcelo Lubaszewski; Bernard Courtois (ITC, 1999)

Design and Test of MEMs. - Bernard Courtois; Jean-Michel Karam; Salvador Mir; Marcelo Lubaszewski; Vladimír Székely; Márta Rencz; Klaus Hofmann; Manfred Glesner (VLSI Design, 1999)

Testing a PWM circuit using functional fault models and compact test vectors for operational amplifiers. - José Vicente Calvano; Vladimir Castro Alves; Marcelo Lubaszewski (Asian Test Symposium, 2000)

TI-BIST: a temperature independent analog BIST for switched-capacitor filters. - Luigi Carro; Érika F. Cota; Marcelo Lubaszewski; Yves Bertrand; Florence Azaïs; Michel Renovell (Asian Test Symposium, 2000)

Reuse of Existing Resources for Analog BIST of a Switch Capacitor Filte. - Érika F. Cota; Michel Renovell; Florence Azaïs; Yves Bertrand; Luigi Carro; Marcelo Lubaszewski (DATE, 2000)

Mixed-Signal Test Bus IEEE 1149.4 Compatible BIST Scheme for Classical 2nd Order Filter Approximations using the Transient Response Analysis Method. - José Vicente Calvano; Vladimir Castro Alves; Marcelo Soares Lubaszewski (LATW, 2000)

The Use of Macromodels on Op-Amp Circuits Fault Modeling. - José Vicente Calvano; Vladimir Castro Alves; Marcelo Lubaszewski (LATW, 2000)

Using Reconfigurability Features to Break Down Test Costs: a Case Study. - Luigi Carro; Luciano Agostini; Roberto Pacheco; Marcelo Lubaszewski (LATW, 2000)

On the Temperature Dependencies of Analog BIST. - Luigi Carro; Michel Renovell; Érika F. Cota; Marcelo Lubaszewski; Yves Bertrand; Florence Azaïs (LATW, 2000)

Synthesis of a 8051-Like Microcontroller Tolerant to Transient Faults. - Érika F. Cota; Marcelo Lubaszewski; Raoul Velasco; Sana Rezgui (LATW, 2000)

Implementing a Self-Checking PROFIBUS Slave. - Margrit Reni Krug; Marcelo Lubaszewski; José Manuel Martins Ferreira; Gustavo Ribeiro da Costa Alves (LATW, 2000)

A Self-Testing Mask Programmable Matrix Using Built-in Current Sensing. - Fernanda Gusmão de Lima; Eduardo D'Avila; Mauricio Moraes; Marcelo Lubaszewski; Ricardo Reis 001 (LATW, 2000)

Fault Models and Compact Test Vectors for MOS OpAmp circuits. - José Vicente Calvano; Vladimir Castro Alves; Marcelo Soares Lubaszewski; Antonio Carneiro de Mesquita Filho (SBCCI, 2000)

Designing a Radiation Hardened 8051-Like Micro-Controller. - Fernanda Gusmão de Lima; Érika F. Cota; Luigi Carro; Marcelo Lubaszewski; Ricardo Reis 001; Raoul Velazco; Sana Rezgui (SBCCI, 2000)

Testability Properties of Vertex Precedent BDDs. - André Inácio Reis; A. Prado; Marcelo Lubaszewski (SBCCI, 2000)

Fault Detection Methodology and BIST Method for 2nd Order Butterworth, Chebyshev and Bessel Filter Approximations. - José Vicente Calvano; Vladimir Castro Alves; Marcelo Lubaszewski (VTS, 2000)

A new adaptive analog test and diagnosis system. - Érika F. Cota; Marcelo Negreiros; Luigi Carro; Marcelo Lubaszewski (IEEE Trans. Instrum. Meas., 2000)

Design of self-checking fully differential circuits and boards. - Marcelo Lubaszewski; Salvador Mir; Vladimir Kolarik; C. Nielsen; Bernard Courtois (IEEE Trans. Very Large Scale Integr. Syst., 2000)

Built-in Test of Analog Non-Linear Circuits in a SOC Environment. - Luigi Carro; André C. Nácul; Daniel Janner; Marcelo Lubaszewski (VLSI-SOC, 2001)

Designing Testable Networks for Transfer Function Realization. - José Vicente Calvano; Vladimir Castro Alves; Marcelo Lubaszewski; Antonio Carneiro de Mesquita Filho (LATW, 2001)

Filter Sensitivity Analysis Using the TRAM. - José Vicente Calvano; Antonio Carneiro de Mesquita Filho; Vladimir Castro Alves; Marcelo Lubaszewski (LATW, 2001)

The Sigma-Delta-Bist Method Applied to Linear Analog Circuits. - L. Cassol; Luigi Carro; Marcelo Lubaszewski (LATW, 2001)

A Test Method for a Broad Class of DSP Circuits. - Érika F. Cota; Luigi Carro; Marcelo Lubaszewski (LATW, 2001)

An Analog-based Approach for MEMS Testing. - Bernard Courtois; Salvador Mir; Benoît Charlot; Marcelo Lubaszewski (LATW, 2001)

A BIST Procedure for Analog Mixers in Software Radio. - André C. Nácul; Luigi Carro; Daniel Janner; Marcelo Lubaszewski (SBCCI, 2001)

Fault Models and Test Generation for OpAmp Circuits - The FFM. - José Vicente Calvano; Antonio Carneiro de Mesquita Filho; Vladimir Castro Alves; Marcelo Lubaszewski (J. Electron. Test., 2001)

Synthesis of an 8051-Like Micro-Controller Tolerant to Transient Faults. - Érika F. Cota; Fernanda Lima 001; Sana Rezgui; Luigi Carro; Raoul Velazco; Marcelo Lubaszewski; Ricardo Reis 001 (J. Electron. Test., 2001)

Guest Editorial. - Marcelo Lubaszewski; Víctor H. Champac (J. Electron. Test., 2001)

Concepção de Circuitos e Sistemas Integrados. - Renato P. Ribas; André Inácio Reis; Marcelo Lubaszewski (RITA, 2001)

Test Planning and Design Space Exploration in a Core-Based Environment. - Érika F. Cota; Luigi Carro; Marcelo Lubaszewski; Alex Orailoglu (DATE, 2002)

Estimating Static Parameters of A-to-D Converters from Spectral Analysis. - Florence Azaïs; Serge Bernard; Yves Bertrand; Mariane Comte; Michel Renovell; Marcelo Lubaszewski (LATW, 2002)

Designing for Test Butterworth and Chebyshev Low-Pass Filters of Any Order. - José Vicente Calvano; Vladimir Castro Alves; Marcelo Lubaszewski; Antonio Carneiro de Mesquita Filho (LATW, 2002)

State Model Approach for Analog Fault Modeling. - José Vicente Calvano; Antonio Carneiro de Mesquita Filho; Marcelo Lubaszewski; Vladimir Castro Alves (LATW, 2002)

Generic and Detailed Search for TAM Definition in Core-Based Systems. - Érika F. Cota; Luigi Carro; Alex Orailoglu; Marcelo Lubaszewski (LATW, 2002)

Testability Properties of BDDs. - Felipe S. Marques 001; Vinícius P. Correia; A. Prado; Marcelo Lubaszewski; André Inácio Reis (SBCCI, 2002)

Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus. - José Vicente Calvano; Vladimir Castro Alves; Antonio Carneiro de Mesquita Filho; Marcelo Lubaszewski (VTS, 2002)

Power-aware NoC Reuse on the Testing of Core-based Systems. - Érika F. Cota; Luigi Carro; Flávio Rech Wagner; Marcelo Lubaszewski (ITC, 2003)

Designing for Test Analog Signal Processors for MEMS-Based Inertial Sensors. - José Vicente Calvano; Marcelo Lubaszewski (IWSOC, 2003)

SIFU! - A Didactic Stuck-at Fault Simulator. - Vinícius P. Correia; Marcelo Lubaszewski; André Inácio Reis (MSE, 2003)

The Impact of NoC Reuse on the Testing of Core-based Systems. - Érika F. Cota; Márcio Eduardo Kreutz; Cesar A. Zeferino; Luigi Carro; Marcelo Lubaszewski; Altamiro Amadeu Susin (VTS, 2003)

The SigmaDelta-BIST Method Applied to Analog Filters. - L. Cassol; O. Betat; Luigi Carro; Marcelo Lubaszewski (J. Electron. Test., 2003)

Test and Design-for-Test of Mixed-Signal Integrated Circuits. - Marcelo Lubaszewski; José Luis Huertas (IFIP Congress Tutorials, 2004)

Testing the Configurable Analog Blocks of Field Programmable Analog Arrays. - Tiago R. Balen; Antonio Andrade Jr.; Florence Azaïs; Michel Renovell; Marcelo Lubaszewski (ITC, 2004)

Reducing test time with processor reuse in network-on-chip based systems. - Alexandre M. Amory; Érika F. Cota; Marcelo Lubaszewski; Fernando Gehm Moraes (SBCCI, 2004)

Improving mixed-signal SOC testing: a power-aware reuse-based approach with analog BIST. - Antonio Andrade Jr.; Érika F. Cota; Marcelo Lubaszewski (SBCCI, 2004)

An Approach to the Built-In Self-Test of Field Programmable Analog Arrays. - Tiago R. Balen; Antonio Andrade Jr.; Florence Azaïs; Marcelo Lubaszewski; Michel Renovell (VTS, 2004)

Searching for Global Test Costs Optimization in Core-Based Systems. - Érika F. Cota; Luigi Carro; Marcelo Lubaszewski; Alex Orailoglu (J. Electron. Test., 2004)

A New FPGA for DSP Applications Integrating BIST Capabilities. - Alex Gonsales; Marcelo Lubaszewski; Luigi Carro; Michel Renovell (J. Electron. Test., 2004)

Reusing an on-chip network for the test of core-based systems. - Érika F. Cota; Luigi Carro; Marcelo Lubaszewski (ACM Trans. Design Autom. Electr. Syst., 2004)

Test Time Reduction Reusing Multiple Processors in a Network-on-Chip Based Architecture. - Alexandre M. Amory; Marcelo Lubaszewski; Fernando Gehm Moraes; Edson I. Moreno (DATE, 2005)

A scalable test strategy for network-on-chip routers. - Alexandre M. Amory; Eduardo Wenzel Brião; Érika F. Cota; Marcelo Lubaszewski; Fernando Gehm Moraes (ITC, 2005)

A constraint-based solution for on-line testing of processors embedded in real-time applications. - Marcelo de Souza Moraes; Érika F. Cota; Luigi Carro; Flávio Rech Wagner; Marcelo Lubaszewski (SBCCI, 2005)

Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays. - Gustavo Pereira; Antonio Andrade Jr.; Tiago R. Balen; Marcelo Lubaszewski; Florence Azaïs; Michel Renovell (VTS, 2005)

A Strategy for Optimal Test Point Insertion in Analog Cascaded Filters. - Florence Azaïs; Marcelo Lubaszewski; Pascal Nouet; Michel Renovell (J. Electron. Test., 2005)

Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks. - Tiago R. Balen; Antonio Q. Andrade; Florence Azaïs; Marcelo Lubaszewski; Michel Renovell (J. Electron. Test., 2005)

Built-in self-test of global interconnects of field programmable analog arrays. - Antonio Andrade Jr.; Gustavo Vieira; Tiago R. Balen; Marcelo Lubaszewski; Florence Azaïs; Michel Renovell (Microelectron. J., 2005)

Wrapper Design for the Reuse of Networks-on-Chip as Test Access Mechanism. - Alexandre M. Amory; Kees Goossens; Erik Jan Marinissen; Marcelo Lubaszewski; Fernando Moraes 001 (ETS, 2006)

Using a software testing technique to identify registers for partial scan implementation. - Margrit R. Krug; Marcelo de Souza Moraes; Marcelo Lubaszewski (SBCCI, 2006)

A cryptography core tolerant to DFA fault attacks. - Carlos Roberto Moratelli; Érika F. Cota; Marcelo Lubaszewski (SBCCI, 2006)

Improving ATPG Gate-Level Fault Coverage by using Test Vectors generated from Behavioral HDL Descriptions. - Margrit R. Krug; Marcelo Lubaszewski; Marcelo de Souza Moraes (VLSI-SoC, 2006)

Functional Test of Field Programmable Analog Arrays. - Tiago R. Balen; José Vicente Calvano; Marcelo Lubaszewski; Michel Renovell (VTS, 2006)

Single Event Upset in SRAM-based Field Programmable Analog Arrays: Effects and Mitigation. - Tiago R. Balen; Fernanda Lima Kastensmidt; Marcelo Lubaszewski; Michel Renovell (ISVLSI, 2007)

Redefining and testing interconnect faults in Mesh NoCs. - Érika F. Cota; Fernanda Lima Kastensmidt; Maico Cassel; Paulo Meirelles; Alexandre M. Amory; Marcelo Lubaszewski (ITC, 2007)

DfT for the Reuse of Networks-on-Chip as Test Access Mechanism. - Alexandre M. Amory; Frederico Ferlini; Marcelo Lubaszewski; Fernando Moraes 001 (VTS, 2007)

Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis. - Tiago R. Balen; José Vicente Calvano; Marcelo Lubaszewski; Michel Renovell (J. Electron. Test., 2007)

Guest Editorial. - Marcelo Lubaszewski; Andrew Richardson 001; C. C. Su (J. Electron. Test., 2007)

Wrapper design for the reuse of a bus, network-on-chip, or other functional interconnect as test access mechanism. - Alexandre M. Amory; Kees Goossens; Erik Jan Marinissen; Marcelo Lubaszewski; Fernando Moraes 001 (IET Comput. Digit. Tech., 2007)

A fault-tolerant, DFA-resistant AES core. - Carlos Roberto Moratelli; Felipe Ghellar; Érika F. Cota; Marcelo Lubaszewski (ISCAS, 2008)

A novel AES cryptographic core highly resistant to differential power analysis attacks. - Felipe Ghellar; Marcelo Lubaszewski (SBCCI, 2008)

A High-Fault-Coverage Approach for the Test of Data, Control and Handshake Interconnects in Mesh Networks-on-Chip. - Érika F. Cota; Fernanda Gusmão de Lima Kastensmidt; Maico Cassel; Marcos Hervé; Pedro Almeida; Paulo Meirelles; Alexandre M. Amory; Marcelo Lubaszewski (IEEE Trans. Computers, 2008)

Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop. - Bozena Kaminska; Marcelo Lubaszewski; José Machado da Silva (VLSI Design, 2008)

Can Functional Test Achieve Low-cost Full Coverage of NoC Faults? - Marcelo Lubaszewski (DFT, 2009)

Improving yield of torus nocs through fault-diagnosis-and-repair of interconnect faults. - Caroline Concatto; Pedro Almeida; Fernanda Lima Kastensmidt; Érika F. Cota; Marcelo Lubaszewski; Marcos Hervé (IOLTS, 2009)

Efficient Test Circuit to Qualify Logic Cells. - Renato P. Ribas; Simone Bavaresco; Marcelo Lubaszewski; André Inácio Reis (ISCAS, 2009)

NoC interconnection functional testing: Using boundary-scan to reduce the overall testing time. - Marcos Barcellos Hervé; Érika F. Cota; Fernanda Lima Kastensmidt; Marcelo Lubaszewski (LATW, 2009)

Using Bulk Built-In Current Sensors and recomputing techniques to mitigate transient faults in microprocessors. - Franco Leite; Tiago R. Balen; Marcos Hervé; Marcelo Lubaszewski; Gilson I. Wirth (LATW, 2009)

Diagnosis of interconnect shorts in mesh NoCs. - Marcos Hervé; Érika F. Cota; Fernanda Lima Kastensmidt; Marcelo Lubaszewski (NOCS, 2009)

Resource-and-time-aware test strategy for configurable quaternary logic blocks. - Érika F. Cota; Luigi Carro; Felipe Pinto; Ricardo Augusto da Luz Reis; Marcelo Lubaszewski (SBCCI, 2009)

Design of an embedded system for the proactive maintenance of electrical valves. - Luiz Fernando Gonçalves; Jefferson Luiz Bosa; Renato V. B. Henriques; Marcelo Lubaszewski (SBCCI, 2009)

Increasing reliability of programmable mixed-signal systems by applying design diversity redundancy. - Gabriel de M. Borges; Luiz Fernando Gonçalves; Tiago R. Balen; Marcelo Lubaszewski (ETS, 2010)

Radiation effects on programmable analog devices and mitigation techniques. - Tiago R. Balen; Marcelo Lubaszewski (IOLTS, 2010)

Efficiently using data splitting and retransmission to tolerate faults in networks-on-chip interconnects. - Matheus Braga; Érika F. Cota; Fernanda Lima Kastensmidt; Marcelo Lubaszewski (ISCAS, 2010)

Diversity TMR: Proof of concept in a mixed-signal case. - Gabriel de M. Borges; Luiz Fernando Gonçalves; Tiago R. Balen; Marcelo Lubaszewski (LATW, 2010)

Fault prediction in electrical valves using temporal Kohonen maps. - Luiz Fernando Gonçalves; Eduardo Luis Schneider; Renato Ventura Bayan Henriques; Marcelo Lubaszewski; Jefferson Luiz Bosa; Paulo Martins Engel (LATW, 2010)

Concurrent test of Network-on-Chip interconnects and routers. - Marcos Hervé; Pedro Almeida; Fernanda Lima Kastensmidt; Érika F. Cota; Marcelo Lubaszewski (LATW, 2010)

Evaluating the effectiveness of a mixed-signal TMR scheme based on design diversity. - Gabriel de M. Borges; Luiz Fernando Gonçalves; Tiago R. Balen; Marcelo Lubaszewski (SBCCI, 2010)

A broad strategy to detect crosstalk faults in network-on-chip interconnects. - Mariza Botelho; Fernanda Lima Kastensmidt; Marcelo Lubaszewski; Érika F. Cota; Luigi Carro (VLSI-SoC, 2010)

Special session 12B: Embedded tutorial test and fault tolerance of networks-on-chip. - Marcelo Lubaszewski; Érika F. Cota (VTS, 2010)

Evaluating energy consumption of homogeneous MPSoCs using spare tiles. - Alexandre M. Amory; Luciano Ost; César A. M. Marcon; Fernando Gehm Moraes; Marcelo Lubaszewski (DATE, 2011)

Investigating the effects of transient faults in Programmable Capacitor Arrays. - Tiago R. Balen; Guilherme Schwanke Cardoso; Odair Lelis Gonçalez; Marcelo Soares Lubaszewski (LATW, 2011)

Task mapping on NoC-based MPSoCs with faulty tiles: Evaluating the energy consumption and the application execution time. - Alexandre M. Amory; César A. M. Marcon; Fernando Gehm Moraes; Marcelo Lubaszewski (International Symposium on Rapid System Prototyping, 2011)

Early estimation of wire length for dedicated test access mechanisms in networks-on-chip based SoCs. - Alexandre M. Amory; Cristiano Lazzari; Marcelo Lubaszewski; Fernando Gehm Moraes (SBCCI, 2011)

Fault Detection, Diagnosis and Prediction in Electrical Valves Using Self-Organizing Maps. - Luiz Fernando Gonçalves; Jefferson Luiz Bosa; Tiago Roberto Balen; Marcelo Lubaszewski; Eduardo Luis Schneider; Renato V. B. Henriques (J. Electron. Test., 2011)

Functional Test of Mesh-Based NoCs with Deterministic Routing: Integrating the Test of Interconnects and Routers. - Marcos Barcellos Hervé; Marcelo de Souza Moraes; Pedro Almeida; Marcelo Lubaszewski; Fernanda Lima Kastensmidt; Érika F. Cota (J. Electron. Test., 2011)

A new test scheduling algorithm based on Networks-on-Chip as Test Access Mechanisms. - Alexandre M. Amory; Cristiano Lazzari; Marcelo Lubaszewski; Fernando Gehm Moraes (J. Parallel Distributed Comput., 2011)

Improving the yield of NoC-based systems through fault diagnosis and adaptive routing. - Caroline Concatto; João Almeida; Guilherme Fachini; Marcos Hervé; Fernanda Lima Kastensmidt; Érika F. Cota; Marcelo Lubaszewski (J. Parallel Distributed Comput., 2011)

Contributions to the evaluation of ensembles of combinational logic gates. - Renato P. Ribas; Simone Bavaresco; N. Schuch; Vinicius Callegaro; Marcelo Lubaszewski; André Inácio Reis (Microelectron. J., 2011)

Low pin count DfT technique for RFID ICs. - Marcelo de Souza Moraes; Marcos Barcellos Hervé; Marcelo Lubaszewski (DFT, 2012)

Impact of TID-induced threshold deviations in analog building-blocks of operational amplifiers. - Guilherme Schwanke Cardoso; Tiago R. Balen; Marcelo Soares Lubaszewski; Rafael Galhardo Vaz; Odair Lelis Goncalez (LATW, 2012)

Evaluating the scalability of test buses. - Alexandre M. Amory; Matheus T. Moreira; Ney Laert Vilar Calazans; Fernando Gehm Moraes; Cristiano Lazzari; Marcelo Soares Lubaszewski (ISSoC, 2013)

Determining the test sources/sinks for NoC TAMs. - Alexandre M. Amory; Edson I. Moreno; Fernando Moraes 001; Marcelo Lubaszewski (ISVLSI, 2013)

Neutron-induced single event effects analysis in a SAR-ADC architecture embedded in a mixed-signal SoC. - Lucas A. Tambara; Fernanda Lima Kastensmidt; Paolo Rech; Tiago R. Balen; Marcelo Lubaszewski (ISVLSI, 2013)

A power management system architecture for LF passive RFID tags. - Fernando da Rocha Paixão Cortes; Juan Pablo Martinez Brito; Everton Ghignatti; Alfredo Olmos; Fernando Chávez; Marcelo Lubaszewski (LASCAS, 2014)

A low-power RF/analog front-end architecture for LF passive RFID tags with dynamic power sensing. - Fernando Paixão Cortes; Juan Pablo Martinez Brito; Rafael Cantalice; Everton Ghignatti; Alfredo Olmos; Fernando Chávez; Marcelo Lubaszewski (IEEE RFID, 2014)

A 2-Transistor Sub-1V Low Power Temperature Compensated CMOS Voltage Reference. - Alfredo Olmos; Juan Pablo Martinez Brito; Fabrício Jorge Antunes Ferreira; Fernando Chávez; Marcelo Soares Lubaszewski (SBCCI, 2014)

A low-power RFID enabled temperature sensor for cold chain management. - Francisco O. O. Gomes; Luciano de Paula; Joao C. S. Santos; Laurent Courcelle; Daniel Piovani; Filipe Viera; Felipe M. Henes; Marcelo Lubaszewski (ISCAS, 2015)

Low power, high-sensitivity clock recovery circuit for LF/HF RFID applications. - Rafael Cantalice; Alexandre Simionovski; Fernando Paixão Cortes; Marcelo Lubaszewski (SBCCI, 2015)

Exploring design diversity redundancy to improve resilience in mixed-signal systems. - Cristiano P. Chenet; Lucas A. Tambara; Gabriel de M. Borges; Fernanda Lima Kastensmidt; Marcelo Soares Lubaszewski; Tiago R. Balen (Microelectron. Reliab., 2015)

Successful prototyping of complex integrated circuits with focused ion beam. - E. Petitprez; Dalton M. Colombo; Felipe M. Henes; Laurent Courcelle; R. Tararam; S. Jacobsen; R. Soares 002; C. Krug; Marcelo Lubaszewski (SBCCI, 2016)

A Highly Reliable Wearable Device for Fall Detection. - João Carlos Britto Filho; Marcelo Lubaszewski (LATS, 2020)

Evaluating Fault Coverage of Structural and Specification-based Tests Obtained With a Low-Cost Analog TPG Tool. - Lucas B. Zilch; Állan G. Ferreira; Marcelo Soares Lubaszewski; Tiago R. Balen (LATS, 2022)

Towards a Machine Learning Based Method for Indirect Test Generation of Mixed-Signal Circuits. - Állan G. Ferreira; Lucas B. Zilch; Vinícius Navarro; Marcelo Soares Lubaszewski; Tiago R. Balen (SBCCI, 2023)

Indirect Test Pattern Generation for Mixed-Signal Circuits Using Machine Learning. - Állan G. Ferreira; Lucas B. Zilch; Marcelo Soares Lubaszewski; Tiago R. Balen (IEEE Des. Test, 2025)