Exploring resistive switching-based memristors in the charge-flux domain: A modeling approach. - Mohamad Moner Al Chawa; Rodrigo Picos; Juan Bautista Roldán; Francisco Jimenez-Molinos; Marco Antonio Villena; Carol de Benito (Int. J. Circuit Theory Appl., 2018)

Reversible dielectric breakdown in h-BN stacks: a statistical study of the switching voltages. - Juan Bautista Roldán; David Maldonado; Francisco Jiménez-Molinos; Christian Acal; Juan Eloy Ruiz-Castro; Ana M. Aguilera; Fei Hui; J. Kong; Y. Shi; Xu Jing; Chao Wen; Marco Antonio Villena; et al. (IRPS, 2020)